Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

ViFT receives test histories for each test location and determines the next test location and intensity of stimulus. ViFT can learn the spatial relationships because ViFT has transformer structures.

NOIDA, India & SAN FRANCISCO--(BUSINESS WIRE)--LambdaTest, a leading cloud-based unified testing platform introduced the Auto-Heal feature, designed to streamline the software testing process. This ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Test automation has been pivotal in accelerating software releases, but it came with a high learning curve that limited its reach. No-code testing platforms helped ease that by enabling teams to ...