The ability to measure nanomaterials, nanoscale features, nano-architectures, and nano-objects has been made possible due to advances in characterization methods over the last few decades. The ...
The method allows for the spatially resolved observation of transport processes in semiconductor devices.
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Engineers have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an aberration-corrected transmission electron microscope (TEM). This combined unit is ...
The SU8600 represents Hitachi's latest Cold Field Emission SEM, integrating advanced imaging modes with three in-lens ...
-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...
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