The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

The BMJ is an international peer reviewed medical journal and a fully "online first" publication. Our publishing model–"continuous publication"– means that all articles appear on bmj.com before being ...

Journal of the Royal Statistical Society. Series C (Applied Statistics), Vol. 62, No. 5 (NOVEMBER 2013), pp. 723-740 (18 pages) We explore a particular fully parametric approach to quantile regression ...

The Mann-Whitney U Test, also known as the Wilcoxon Rank Sum Test, is a non-parametric statistical test used to compare two samples or groups. The Mann-Whitney U Test assesses whether two sampled ...

What is the Friedman test? The Friedman test, also sometimes referred to as Friedman’s two-way analysis of variance by ranks, is a non-parametric statistical test used to investigate whether groups of ...

Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...

The analysis of phenotypic change is important for several evolutionary biology disciplines, including phenotypic plasticity, evolutionary developmental biology, morphological evolution, physiological ...